Blog: Inspection Matters

New Mek PowerSpector AOI is launched

April 22, 2013

Last week at SMT Nuremberg we showed our new generation of AOI technology. The new Mek AOI systems have several Inspection head options, each using Cameras with large pixel size giving better colour fidelity and improved signal to noise ratio and custom telecentric optics with true colour image processing. Head selection is based on application requirement, position in the process and inspection depth and resolution required. Applications include component only pre-reflow inspection through to multi-camera,…
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New AOI at SMT Nuremberg

April 15, 2013

This week Mek (Marantz Electronics) will be at the SMT Packaging Hybrid show in Nuremberg with our German partner SmartRep GmbH. Here we’ll be launching an entirely new generation of AOI technology to be deployed across a line of new Desktop and In-line inspection machines. Meks latest PowerSpector Series with FDAz head features an entirely new generation of mechanical, camera, sensor, and software technologies that measurably propel the performance of Mek AOI beyond the norm…
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THT AOI Inspection

January 14, 2013

Through Hole Technology for assembling electronic circuits is often described as an old fashioned technology that is losing its popularity and being replaced more and more by SMT, surface mount technology. No wonder, as electronic devices where SMT is used are more compact, thinner, lighter, faster and consume less energy. SMT is also much more efficient from an assembly point of view and surface mount device components cost less. Basically the replacement of THT by SMT…
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Welcome to Inspection Matters

August 15, 2012

Welcome to Inspection Matters, one of many Mek initiatives and an integral part of our new web site. We hope you enjoy it! For those of you new to Mek, or even for some with whom we’ve done business only through our global partner network, a little background… We’re a former division of Marantz…well known for premium Audio/Video products. MEK Japan (Marantz Electronics Kabushiki Kaisha) developed its first AOI system in 1994. Designed to inspect…
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